Messung der Barriereschicht

It is based on a non-contact, transmission measurement principle. 

For the determination of the EVOH layer thickness, a wide infrared spectrum of the plastic is recorded and the resulting absorption of the EVOH polymer molecules is evaluated by using our modern analytic methods.


Multi layer plastic films and sheet for food packaging.

← 8 m →

XRS thickness gauges are available in widths of up to 8 m

≤ 0,2 μm

Ultra-precise thickness measuring with an accuracy of ≤ 0,2 µm

Measuring Principle

XRS is a non-contact measurement system. The x-ray tube emits energy photons. Measurement is based on the absorption of x-ray particles from the source to determine the thickness and basis weight.

This results in greater control of the process whether it’s film extrusion, sheet extrusion and extrusion coating.

Technical Specifications

Technical Data EKO KAPA IR
Measuring System Capacitive/eddy current Infrared
Thickness range Up to 3 mm > 5 µm*
Measuring gap 4.4 mm 35 mm
Sensor resolution ≤ 0.1 µm 0.5 µm
Repeatability ≤ ± 0.5 µm ≤ 2 µm*
Measurement speed 10-300 mm/s adjustable 25 mm/s adjustable
Calibration necessary for each material

* Depending on product and calibration.

Please download the PDF data sheet for detailed technical specifications! 

XRS in Action

Contact our Experts

Our experts are always available for your inquiries and technical consultation. Please contact us anytime at our HQ or refer to local SBI Mechatronik  representatives in your country!

Andreas Huemer

Sales Director

Andreas will develop a fitting solution for your requirements based on our products and services. 


tel. +43 (0) 7242 60649 

Roman Geist

Head of Engineering

Roman is your expert for technical questions, application development and custom solutions.


tel. +43 (0) 2952 50701 

Bitte füllen Sie die Informationen aus:

This site is registered on wpml.org as a development site.