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It is based on a non-contact, transmission measurement principle.
For the determination of the EVOH layer thickness, a wide infrared spectrum of the plastic is recorded and the resulting absorption of the EVOH polymer molecules is evaluated by using our modern analytic methods.
Multi layer plastic films and sheet for food packaging.
XRS thickness gauges are available in widths of up to 8 m
Ultra-precise thickness measuring with an accuracy of ≤ 0,2 µm
XRS is a non-contact measurement system. The x-ray tube emits energy photons. Measurement is based on the absorption of x-ray particles from the source to determine the thickness and basis weight.
This results in greater control of the process whether it’s film extrusion, sheet extrusion and extrusion coating.
| Technical Data | EKO | KAPA IR |
|---|---|---|
| Measuring System | Capacitive/eddy current | Infrared |
| Thickness range | Up to 3 mm | > 5 µm* |
| Measuring gap | 4.4 mm | 35 mm |
| Sensor resolution | ≤ 0.1 µm | 0.5 µm |
| Repeatability | ≤ ± 0.5 µm | ≤ 2 µm* |
| Measurement speed | 10-300 mm/s adjustable | 25 mm/s adjustable |
| Calibration | necessary for each material | |
* Depending on product and calibration.
Please download the PDF data sheet for detailed technical specifications!
Our experts are always available for your inquiries and technical consultation. Please contact us anytime at our HQ or refer to local SBI Mechatronik representatives in your country!
Andreas will develop a fitting solution for your requirements based on our products and services.
a.huemer@sbi-mechatronik.com
tel. +43 (0) 7242 60649
Roman is your expert for technical questions, application development and custom solutions.
r.geist@sbi-mechatronik.com
tel. +43 (0) 2952 50701
SBI Mechatronik GmbH
Tel.: +43 295250701
Kaplanstraße 12
2020 Hollabrunn – Austria
